Product Details
AR XRF PRIME is a professional benchtop Energy Dispersive X-Ray Fluorescence (ED-XRF) platform designed for routine quantitative and qualitative elemental analysis.
The system is designed for analysis across metals, minerals, environmental materials, petroleum products, electronics, coatings and research samples.
AR XRF Prime uses a direct-excitation ED-XRF architecture designed for laboratories requiring multi-element analysis across a broad range of sample forms and concentrations, from trace-level measurements to major-element composition.
Built for High-Throughput Elemental Analysis
The platform combines a high-energy digital X-ray excitation system with a Peltier-cooled Fast Silicon Drift Detector and digital pulse processing.
Automated sample handling, motorised filter and collimator selection, and camera-assisted targeting support a repeatable laboratory workflow.
Analytical Coverage
The analytical range extends from Sodium (Na, Z=11) to Uranium (U, Z=92). Detection limits are application and matrix dependent and are specified as ≤10 ppm to 100% concentration in the supplied product document.
Key Highlights
- 70 kV maximum tube voltage
- 500,000 cps maximum count rate
- 70 mm² Fast SDD active area
- Na–U analytical range
- Peltier thermoelectric detector cooling
- 32-position motorised sample changer
- Integrated semiconductor camera
- Automated sample mounting
- Windows-based analytical software
Main Features
High-Energy Excitation
70 kV digital X-ray excitation provides the energy required for broad elemental coverage and demanding higher-Z applications.
Fast SDD Detection
A 70 mm² Peltier-cooled Fast SDD combines high count-rate capability with spectral resolution.
Digital Signal Processing
The system uses a proprietary DAS (Dynamically Adaptive Shaping) digital pulse processor with an 80 MHz sampling rate.
Automated Optics
Motorised filter and collimator selection supports application-specific excitation conditions.
Targeted Measurements
An integrated semiconductor camera supports both micro and macro sample observation and measurement targeting.
Automated Sample Flow
A 32-position motorised sample changer with integrated spinner supports unattended measurement sequences.
Wide Sample Compatibility
The system supports solids, powders, liquids, thin films, coatings, granules, suspensions and foreign particles.
Analytical Software
Windows-based software supports Fundamental Parameters, empirical calibration, thin-film FP and spectral comparison methods.
Applications
Metals & Alloys
Grade identification, incoming inspection, alloy verification and scrap sorting.
Mining & Geochemistry
Rapid elemental screening of ores, minerals and geological materials.
Environment & Soil
Screening of soils, sediments, waste and contaminated materials.
Rare Earth Elements
K-line analysis of selected lanthanides under suitable excitation conditions.
Petroleum & Petrochemicals
Elemental determination in fuels, oils and related process materials.
Electronics
Screening for regulated elements and material verification in components and assemblies.
Coatings
Targeted analysis and thin-film calculations for coatings and deposited layers.
Jewellery & Coating Assessment
Composition verification, karatage-related applications and coating assessment.
Workflow: From Sample to Result
Place solids, powders, liquids, coatings or other suitable samples in the chamber.
Use the integrated camera and selected collimator to define the measurement location.
The X-ray source and selected filter provide the excitation conditions for the application.
The Fast SDD captures the fluorescence spectrum while the digital processor handles high-rate pulse acquisition.
FP, empirical calibration, thin-film FP or spectral comparison methods convert the spectrum into results.
Software & Analytical Methods
- Fundamental Parameters (FP) for model-based quantitative analysis
- Empirical calibration for established routine methods
- Thin-film FP workflows for coatings and thin layers
- Background FP and manual spectral comparison tools
- Standardless qualitative identification of unknown samples
- Tabular and spectral presentation of elemental results
Technical Specifications
| Parameter | Specification |
|---|---|
| Excitation System — X-Ray Source | |
| Anode Material | Tungsten (W), Rhodium (Rh), Silver (Ag) |
| Maximum Tube Voltage | 70 kV |
| Maximum Tube Current | 1,500 µA |
| X-Ray Power | 12 W | 50 W |
| Stability | ±0.01% |
| Excitation Type | Direct excitation |
| Safety Functions | Automatic X-ray tube ageing; automatic shutdown |
| Filter Changer | 8-position motorised |
| Collimator Changer | 5-position motorised; 1–10 mm range; computer operated |
| Detector Assembly | |
| Detector Type | Fast Silicon Drift Detector (Fast SDD) |
| Active Area | 70 mm² |
| Energy Resolution | <140 eV at Mn Kα | <85 eV at Al Kα |
| Maximum Count Rate | 500,000 cps |
| Cooling | Peltier thermoelectric; no liquid nitrogen required |
| Signal Processing | |
| Digital Pulse Processor | Proprietary DAS (Dynamically Adaptive Shaping) |
| Sampling Rate | 80 MHz |
| MCA Channels | 4,096 |
| Elemental Analysis | |
| Analytical Range | Sodium (Na, Z=11) to Uranium (U, Z=92) |
| Detection Limits | ≤10 ppm to 100% concentration; application and matrix dependent |
| Rare-Earth Coverage | La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er via K-line |
| Sample Handling | |
| Sample Types | Solids, powders, liquids, thin films, coatings, granules, suspensions and foreign particles |
| Sample Chamber Atmosphere | Air or helium |
| Sample Observation | Integrated semiconductor camera for both micro and macro view |
| Autosampler | 32-position motorised sample changer with integrated spinner |
| Software & Analytical Methods | |
| Operating System | Windows 10 / 11 |
| Analysis Algorithms | Fundamental Parameters (FP), empirical calibration, thin-film FP, background FP, manual spectral comparison |
| Qualitative Analysis | Standardless identification of unknown samples |
| Output | Elemental concentration in tabular and spectral form |
| Calibration Standards | Annual calibration with certified reference materials; standards supplied by manufacturer |
| Control & Hardware | |
| Computing Platform | Windows-based PC |
| Automation | Automated sample mounting, X-ray source and detector assembly |
| Physical & Environmental | |
| Dimensions | 430 × 340 × 200 mm |
| Weight | 18 kg |
| Power Consumption | 50 W (instrument) |
| Operating Temperature | −5 °C to +50 °C |
Note: Actual detection limits, precision and measurement time depend on the element, matrix, sample preparation, calibration model and measurement condition.
Quality, Service & Support
System Warranty
One year on the complete instrument and control system. Additional warranty coverage can be provided as required.
Calibration Service
Annual calibration with certified reference standards, with certificate issued and reference samples supplied by the manufacturer.
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